scanning electron microscopy (Q54): Difference between revisions
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(Added [en] alias: SEM) |
(Created claim: subclass of (P24): electron microscopy (Q94)) |
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| Property / subclass of | |||
| Property / subclass of: electron microscopy / rank | |||
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Revision as of 17:31, 15 March 2024
No description defined
- SEM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | scanning electron microscopy |
No description defined |
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